@article{KHOJASTEHDANA2025110405,
title = {A reliability framework for NB-IoT devices: Addressing transient faults and silent data corruptions},
journal = {Computers and Electrical Engineering},
volume = {124},
pages = {110405},
year = {2025},
issn = {0045-7906},
doi = {https://doi.org/10.1016/j.compeleceng.2025.110405},
url = {https://www.sciencedirect.com/science/article/pii/S0045790625003489},
author = {Fatemeh {Khojasteh Dana} and Seyedeh Fatemeh Anvari and Hamid R. Zarandi}
}